TrustSeal Verified

X Ray Fluorescence Measuring System

X Ray Fluorescence Instrument

Ask Price

X Ray Fluorescence Instrument
  • Mobility: Benchtop
  • Spectral Bandwidth: 1 nm
  • Brand: FISCHER
  • Model Name/Number: XAN Series
  • Display: Digital
  • Usage/ Application: Laboratory use
  • Mobility: Benchtop
  • Spectral Bandwidth: 1 nm
  • Brand: FISCHER
  • Model Name/Number: XAN Series
  • Display: Digital
  • Usage/ Application: Laboratory use
  • Delivery Time: 3 Weeks
ED-XRF Spectrometer
  • Multi-Layer thickness measurement
  • Material Analysis
  • Trace Analysis for RoHS Compliance
  • Portable and Handheld XRF

 


X-ray fluorescence instruments are an advanced range of analyzing instrument which found applications in various industries. These X-ray fluorescence instruments are widely used for analysis of alloys, coating thickness analysis of metal finishing, positive material identification and scrap metal sorting. These work on the principle of X-ray emission and excitement of atoms.

know more

EDXRF for Multilayer Coating Thickness Measurement Analyzer

Ask Price

EDXRF for Multilayer Coating Thickness Measurement Analyzer
  • Mobility: Benchtop
  • Brand: Fischer
  • Model Name/Number: EDXRF
  • Sensitivity: superior accuracy
  • Display: Digital
  • Usage/ Application: Industrial use
  • Mobility: Benchtop
  • Brand: Fischer
  • Model Name/Number: EDXRF
  • Sensitivity: superior accuracy
  • Display: Digital
  • Usage/ Application: Industrial use
  • Dimension: 403 x 588 x 444 mm
  • Power Supply: AC 230 V 50 / 60 Hz
  • Power consumption: max. 120 W
  • Protection Class: IP40

Coating thickness – EDXRF is basically a measuring device for measuring thickness of electroless and electroplating coatings. This coating thickness – EDXRF is designed precisely by using sharp edge technology and latest machines. It is checked for quality under various set norms of the industry. This coating thickness – EDXRF is widely demanded in different industrial applications for its accurate measurement and precise dimensions.

know more

X-Ray Fluorescence Measuring System

Ask Price

X-Ray Fluorescence Measuring System
  • Mobility: Benchtop
  • Model Name/Number: EDXRF
  • Sensitivity: superior accuracy
  • Display: Digital
  • Usage/ Application: Laboratory,Industrial use
  • Mobility: Benchtop
  • Model Name/Number: EDXRF
  • Sensitivity: superior accuracy
  • Display: Digital
  • Usage/ Application: Laboratory,Industrial use

Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.



TYPICAL FIELDS OF APPLICATION 

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating bathsSoftware Used : WinFTM®

Design Standards : DIN ISO 3497 and ASTM B 568

TYPICAL FIELDS OF APPLICATION 

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating baths

General Specification

 

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)

 for material analysis and coating thickness measurement.


Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

 option WinFTM® BASIC.


Design:Bench top unit with upwards opening hood


Measuring direction:Bottom up


X-Ray Source

 

X-ray tube:


XUL 210, XUL 220:Micro-focus tungsten tube with beryllium window


XULM 240:Micro-focus tungsten tube with beryllium window


High voltage:Three steps: 30 kV, 40 kV, 50 kV


Aperture (Collimator):


XUL 210, XUL 220:Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils)


XULM 240:4 x changeable


Standard (523-440):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils);


 0.2 x 0.03 mm (7.9 x 1.2 mils)


Optional (523-366):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils);


 0.3 x 0.05 (11.8 x 2 mils)


Optional (524-061):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.3 x 0.05 mm (11.8 x 2 mils);



Primary filter:


XUL 210, XUL 220:fixed

XULM 240:3 x changeable (Standard configuration: Nickel, Aluminum, no filter)


Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement.Spot size is shown in the video image.


 Smallest measurement spot:


 XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils)


 XULM 240: approx. Ø 0,1 mm (3.9 mils)


X-Ray Detection

 

X-ray detector:Proportional counter tube


Absorber:XULM 240 only: optional cobalt or nickel absorber


Measuring distance:0 … 25 mm (0 … 1 in)

Optional: Fischer WinFTM® BASIC, PDM®, SUPER

know more

Explore More Categories

x

Send us a Quick Message

country flag
x

Provide Us More Details

Purpose of Requirement:

Reselling End Use Raw Material

We recommend you to enter details of your requirement to get quick quotations.
Back
company logo

Fischer Measurement Technologies India Private Limited