X Ray Fluorescence Measuring System

X-Ray Fluorescence Measuring System

X-Ray Fluorescence Measuring System

Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.



TYPICAL FIELDS OF APPLICATION 

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating bathsSoftware Used : WinFTM®

Design Standards : DIN ISO 3497 and ASTM B 568

TYPICAL FIELDS OF APPLICATION 

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating baths

General Specification

 

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)

 for material analysis and coating thickness measurement.


Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

 option WinFTM® BASIC.


Design:Bench top unit with upwards opening hood


Measuring direction:Bottom up


X-Ray Source

 

X-ray tube:


XUL 210, XUL 220:Micro-focus tungsten tube with beryllium window


XULM 240:Micro-focus tungsten tube with beryllium window


High voltage:Three steps: 30 kV, 40 kV, 50 kV


Aperture (Collimator):


XUL 210, XUL 220:Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils)


XULM 240:4 x changeable


Standard (523-440):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils);


 0.2 x 0.03 mm (7.9 x 1.2 mils)


Optional (523-366):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils);


 0.3 x 0.05 (11.8 x 2 mils)


Optional (524-061):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.3 x 0.05 mm (11.8 x 2 mils);



Primary filter:


XUL 210, XUL 220:fixed

XULM 240:3 x changeable (Standard configuration: Nickel, Aluminum, no filter)


Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement.Spot size is shown in the video image.


 Smallest measurement spot:


 XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils)


 XULM 240: approx. Ø 0,1 mm (3.9 mils)


X-Ray Detection

 

X-ray detector:Proportional counter tube


Absorber:XULM 240 only: optional cobalt or nickel absorber


Measuring distance:0 … 25 mm (0 … 1 in)

Optional: Fischer WinFTM® BASIC, PDM®, SUPER

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Purpose of Requirement:

Reselling End Use Raw Material

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    Rakesh Bhan

    (Managing Director)

    Fischer Measurement Technologies India Private Limited

    Hinjawadi, Pune, Maharashtra, India

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