• Multi-Layer thickness measurement
• Material Analysis
• Trace Analysis for RoHS Compliance
• Portable and Handheld XRF

X-ray fluorescence instruments are an advanced range of analyzing instrument which found applications in various industries. These X-ray fluorescence instruments are widely used for analysis of alloys, coating thickness analysis of metal finishing, positive material identification and scrap metal sorting. These work on the principle of X-ray emission and excitement of atoms.

Coating thickness – EDXRF is basically a measuring device for measuring thickness of electroless and electroplating coatings. This coating thickness – EDXRF is designed precisely by using sharp edge technology and latest machines. It is checked for quality under various set norms of the industry. This coating thickness – EDXRF is widely demanded in different industrial applications for its accurate measurement and precise dimensions.

Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating bathsSoftware Used : WinFTM®

Design Standards : DIN ISO 3497 and ASTM B 568

Measurements on small parts like screws, bolts and nuts

Measurements on contacts and electronic components

Determining of the composition of electroplating baths

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)

 for material analysis and coating thickness measurement.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

 option WinFTM® BASIC.

Design:Bench top unit with upwards opening hood

Measuring direction:Bottom up

X-ray tube:

XUL 210, XUL 220:Micro-focus tungsten tube with beryllium window

XULM 240:Micro-focus tungsten tube with beryllium window

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):

XUL 210, XUL 220:Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils)

XULM 240:4 x changeable

Standard (523-440):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils);

 0.2 x 0.03 mm (7.9 x 1.2 mils)

Optional (523-366):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils);

 0.3 x 0.05 (11.8 x 2 mils)

Optional (524-061):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.3 x 0.05 mm (11.8 x 2 mils);

Primary filter:

XUL 210, XUL 220:fixed

XULM 240:3 x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement.Spot size is shown in the video image.

 Smallest measurement spot:

 XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils)

 XULM 240: approx. Ø 0,1 mm (3.9 mils)

X-ray detector:Proportional counter tube

Absorber:XULM 240 only: optional cobalt or nickel absorber

Measuring distance:0 … 25 mm (0 … 1 in)

Optional: Fischer WinFTM® BASIC, PDM®, SUPER