Fischer Measurement Technologies India Private Limited
Pune, Maharashtra
GST 27AAACF9487H1Z6
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X-ray fluorescence instruments are an advanced range of analyzing instrument which found applications in various industries. These X-ray fluorescence instruments are widely used for analysis of alloys, coating thickness analysis of metal finishing, positive material identification and scrap metal sorting. These work on the principle of X-ray emission and excitement of atoms.
Coating thickness – EDXRF is basically a measuring device for measuring thickness of electroless and electroplating coatings. This coating thickness – EDXRF is designed precisely by using sharp edge technology and latest machines. It is checked for quality under various set norms of the industry. This coating thickness – EDXRF is widely demanded in different industrial applications for its accurate measurement and precise dimensions.
Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.
Measurements on small parts like screws, bolts and nuts
Measurements on contacts and electronic components
Determining of the composition of electroplating bathsSoftware Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568
TYPICAL FIELDS OF APPLICATIONMeasurements on small parts like screws, bolts and nuts
Measurements on contacts and electronic components
Determining of the composition of electroplating baths
General Specification
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)
for material analysis and coating thickness measurement.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Bottom up
X-ray tube:
XUL 210, XUL 220:Micro-focus tungsten tube with beryllium window
XULM 240:Micro-focus tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):
XUL 210, XUL 220:Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils)
XULM 240:4 x changeable
Standard (523-440):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils);
0.2 x 0.03 mm (7.9 x 1.2 mils)
Optional (523-366):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils);
0.3 x 0.05 (11.8 x 2 mils)
Optional (524-061):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.3 x 0.05 mm (11.8 x 2 mils);
Primary filter:
XUL 210, XUL 220:fixed
XULM 240:3 x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot:
XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils)
XULM 240: approx. Ø 0,1 mm (3.9 mils)
X-ray detector:Proportional counter tube
Absorber:XULM 240 only: optional cobalt or nickel absorber
Measuring distance:0 … 25 mm (0 … 1 in)
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
We will contact you soon !
Rakesh Bhan
(Managing Director)
Fischer Measurement Technologies India Private Limited
Hinjawadi, Pune,
Maharashtra,
India