Solar Thin Film Coating Measurement Xan 5000

The instruments of the FISCHERSCOPE X-RAY 5000 series are innovative, energy dispersive x-ray fluorescence measuring systems (EDXRF) for in-line applications in industrial production sites. They are especially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production lines.Their rugged design specifically meets the tough demands of industrial environments and for continuous operation.

TYPICAL AREAS OF APPLICATION ARE: 

In the photovoltaic industry, e. g. CIGS, CIS, CdTe

Measurements on glass panels, foils and belts

Measurements on very hot surfaces (water cooled version)

General Specification

 

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to

 analyze and measure coatings and layer systems continuously in production

processes.

Element range:Sodium Na (11) to Uranium U (92) if measured in vacuum

Chlorine Cl (17) to Uranium U (92) if measured in the atmosphere