Coulometric Method for Coating Thickness Measurement
Couloscope Step Test measurement: 4-nickel-coating system on aluminum,iron,or ABS
Model Number: COULOSCOPE CMS2
Selectable Measurement Units: 1/4m or mils.
This benchtop coating thickness measurement unit – Couloscope CMS2 is used to measure metallic coating over the metallic and nonmetallic substrate. It can measure both single layer and multi-layer coating. It is provided with the graphical display for having a clear view of measurement. It has various predefined measurement applications for various types of metal coatings. Our benchtop coating thickness measurement unit – coloscope CMS2 has selectable measurement units and has various display languages options such as Asian, South American and European.
Evaluation of measurement data in the table or graphic format
Automatic or manual measurement switch-off
COULOSCOPE CMS2 It is the ideal instrument for measuring the thickness of virtually any metallic coating on metallic or nonmetallic substrates, especially also of multiple coatings, if non-destructive methods cannot be used.
The COULOSCOPE CMS2 instruments measure the thickness of virtually any metallic coating on metallic or nonmetallic substrates.
Measurement of single coating and multi-coating systems.
Graphical display for the clear view of the measurements, the set coating system, and the parameters as deplating rate and test area size.
Many predefined measurement applications for the most metal coatings.
Selectable measurement units: μm or mils.
European, South American, and Asian display languages
(ED-XRFA) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilised with modern equipment.
ED-XRFA is a very universal method offering some outstanding advantages. It covers virtually all technically relevant elements and works non-destructively and without contact. Measuring times range in the seconds, rarely longer than one minute. Measurements can be completed quickly and usually without extensive sample preparation. With ED-XRFA, it is possible to measure both thickness and chemical composition of homogeneous materials and coatings. Even traces of harmful substances can be detected in the widest variety of samples.
Moreover, X-ray fluorescence analysis is a very clean method, as no chemicals are used. Due to the protective instrument design, the X-radiation poses no risk for operator or environment: FISCHERSCOPE X-RAY instruments are absolutely safe.