Fischer Measurement Technologies India Private Limited
Pune, Maharashtra
GST 27AAACF9487H1Z6
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The COULOSCOPE CMS2 instruments measure the thickness of virtually any metallic coating on metallic or nonmetallic substrates.
Instrument features:
The Energy Dispersive X-Ray Fluorescence Analysis
(ED-XRFA) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilised with modern equipment.
ED-XRFA is a very universal method offering some outstanding advantages. It covers virtually all technically relevant elements and works non-destructively and without contact. Measuring times range in the seconds, rarely longer than one minute. Measurements can be completed quickly and usually without extensive sample preparation. With ED-XRFA, it is possible to measure both thickness and chemical composition of homogeneous materials and coatings. Even traces of harmful substances can be detected in the widest variety of samples.
Moreover, X-ray fluorescence analysis is a very clean method, as no chemicals are used. Due to the protective instrument design, the X-radiation poses no risk for operator or environment: FISCHERSCOPE X-RAY instruments are absolutely safe.
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Rakesh Bhan
(Managing Director)
Fischer Measurement Technologies India Private Limited
Hinjawadi, Pune,
Maharashtra,
India