Coating Thickness Coulometric Method

XRF Coating Thickness Measurement Analyzer

XRF Coating Thickness Measurement Analyzer
  • XRF Coating Thickness Measurement Analyzer
  • XRF Coating Thickness Measurement Analyzer

The Energy Dispersive X-Ray Fluorescence Analysis

(ED-XRFA) is a method for measuring the thickness of coatings and for analysing materials. It can be used for the qualitative and quantitative determination of the elemental composition of a material sample as well as for measuring coatings and coating systems. In both laboratory and industrial environments, this method is now well established and can be readily utilised with modern equipment.

ED-XRFA is a very universal method offering some outstanding advantages. It covers virtually all technically relevant elements and works non-destructively and without contact. Measuring times range in the seconds, rarely longer than one minute. Measurements can be completed quickly and usually without extensive sample preparation. With ED-XRFA, it is possible to measure both thickness and chemical composition of homogeneous materials and coatings. Even traces of harmful substances can be detected in the widest variety of samples.

Moreover, X-ray fluorescence analysis is a very clean method, as no chemicals are used. Due to the protective instrument design, the X-radiation poses no risk for operator or environment: FISCHERSCOPE X-RAY instruments are absolutely safe.


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Coulometric Method for Coating Thickness Measurement

Coulometric Method for Coating Thickness Measurement
  • Coulometric Method for Coating Thickness Measurement
  • Coulometric Method for Coating Thickness Measurement

This benchtop coating thickness measurement unit – Couloscope CMS2 is used to measure metallic coating over the metallic and nonmetallic substrate. It can measure both single layer and multi-layer coating. It is provided with the graphical display for having a clear view of measurement. It has various predefined measurement applications for various types of metal coatings. Our benchtop coating thickness measurement unit – coloscope CMS2 has selectable measurement units and has various display languages options such as Asian, South American and European.

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Description:


The COULOSCOPE CMS2 instruments measure the thickness of virtually any metallic coating on metallic or nonmetallic substrates.


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    Fischer Measurement Technologies India Private Limited

    Hinjawadi, Pune, Maharashtra, India

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