Coating Thickness Electroplating Electroless

Coating Thickness Gauge For Electroplating and Electroless Coating : XDL

Coating Thickness Gauge For Electroplating and Electroless Coating : XDL

Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard.


XDL 210: Plane support stage, fixed Z-axis

XDL 220: Plane support stage, motor-driven Z-axis

XDL 230: Manually operable XY-stage, motor-driven Z-axis

XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis


Measurement of electroplated mass-produced parts

Inspection of thin coatings, e.g., decorative chromium-plating

Analysis of functional coatings in the electronics and semiconductor industries

Automated measurements, e.g., on printed circuit boards

Solution analysis in the electroplating

General Specification


Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to

 determine thin coatings and for the solution analysis.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

 option WinFTM® BASIC.

Design:Bench top unit with upwards opening hood

Measuring direction:Top down

X-Ray Source


X-ray tube:Tungsten tube with beryllium window

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):Ø 0.3 mm (11.8 mils), Optional: Ø 0.1 mm (3.9 mils), Ø 0.2 mm (7.9 mils),

 slot 0.3 x 0.05 mm (11.8 x 2 mils)

Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement.Spot size is shown in the video image.

 Smallest measurement spot: approx.

 Ø 0.2 mm (7.9 mils)

X-Ray Detection


X-ray detector:Proportional counter tube

Measuring distance:0 … 80 mm (0 … 3.2 in)

 Distance compensation with patented DCM method for simplified

 measurements at varying distances. For particular applications or for

 higher demands on accuracy anadditional calibration might be necessary.

Sample Alignment


Sample positioning:Manually

Video microscope:High-resolution CCD color camera for optical monitoring of the

 measurement location along the primary beam axis,Crosshairs with a

 calibrated scale (ruler) and spot-indicator,Adjustable LED illumination

Zoom factor:Digital 1x, 2x, 3x, 4x

Evaluation Unit



Software:Standard: Fischer WinFTM® LIGHT

 Optional: Fischer WinFTM® BASIC, PDM®, SUPER

Provide Us More Details
Purpose of Requirement:

Reselling End Use Raw Material


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    Rakesh Bhan

    (Managing Director)

    Fischer Measurement Technologies India Private Limited

    Hinjawadi, Pune, Maharashtra, India

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