Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard.
MODELS
XDL 210: Plane support stage, fixed Z-axis
XDL 220: Plane support stage, motor-driven Z-axis
XDL 230: Manually operable XY-stage, motor-driven Z-axis
XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
TYPICAL FIELDS OF APPLICATION
Measurement of electroplated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on printed circuit boards
Solution analysis in the electroplating
General Specification
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to
determine thin coatings and for the solution analysis.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Top down
X-Ray Source
X-ray tube:Tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 0.3 mm (11.8 mils), Optional: Ø 0.1 mm (3.9 mils), Ø 0.2 mm (7.9 mils),
slot 0.3 x 0.05 mm (11.8 x 2 mils)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot: approx.
Ø 0.2 mm (7.9 mils)
X-Ray Detection
X-ray detector:Proportional counter tube
Measuring distance:0 … 80 mm (0 … 3.2 in)
Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.
Sample Alignment
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the
measurement location along the primary beam axis,Crosshairs with a
calibrated scale (ruler) and spot-indicator,Adjustable LED illumination
Zoom factor:Digital 1x, 2x, 3x, 4x
Evaluation Unit
Computer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
