FISCHER EDXRF Machine for Multilayer coating thickness measurement and Material Analysis
The FISCHERSCOPE X-RAY XAN 250 is a high performance, compact and universally applicable x-ray measuring instrument. It is well suited for the non-destructive coating thickness measurement and material analysis.The XAN 250 is especially well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations. Typical fields of application:• Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries• Trace analysis for consumer protection, e.g. lead content in toys• Analysis of alloys with highest requirements of accuracy in the jewellery and watch industries and in metal refineries• Research in universities and in the industries
To create ideal excitation conditions for every measurement, the instrument features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high accuracy and good detection sensitivity.