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X Ray Fluorescence Measuring Instrument

X-Ray Fluorescence Measuring Instrument : XDLM

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X-Ray Fluorescence Measuring Instrument : XDLM
Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely...
Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations.
MODELSXDLM 231: Plane support stage, motor-driven Z-axis
XDLM 232: Manually operable XY-stage, motor-driven Z-axis
XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
TYPICAL FIELDS OF APPLICATIONMeasurement of electroplated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on printed circuit boards
General SpecificationIntended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to
determine thin coatings, small structures and alloys.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.

Design:Bench top unit with upwards opening hood

Measuring direction:Top down

X-Ray SourceX-ray tube:Micro-focus tungsten tube with beryllium window

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):4x changeable

Standard (523-440):[mm]: Ø 0.1, Ø 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: Ø 3.9, Ø 7.9, 2 x 2, 7.9 x 1.2

Optional (523-366):[mm]: Ø 0.1, Ø 0.2, Ø 0.3, 0.3 x 0.05; [mils]: Ø 3.9, Ø 7.9, Ø 11.8, 11.8 x 2

Optional (524-061):[mm]: Ø 0.1, Ø 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: Ø 3.9, Ø 7.9, 11.8 x 2, 2 x 2

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.

Smallest measurement spot: approx.

Ø 0.1 mm (3.9 mils) with aperture
0.05 x 0.05 mm (2 x 2 mils)
X-Ray DetectionX-ray detector:Proportional counter tube

Measuring distance:0 … 80 mm (0 … 3.2 in)

Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.

Sample AlignmentSample positioning:Manually

Video microscope:High-resolution CCD colour camera for optical monitoring of the
measurement locationalong the primary beam axis, manual focusing
and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator,
adjustable LED illumination,laser pointer (class 1) to support accurate
sample placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Evaluation UnitComputer:Windows®-PC

Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER

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Fischer Measurement Technologies India Private Limited