Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations. MODELSXDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis TYPICAL FIELDS OF APPLICATIONMeasurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards General SpecificationIntended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Top down
X-Ray SourceX-ray tube:Micro-focus tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):4x changeable
Standard (523-440):[mm]: Ø 0.1, Ø 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: Ø 3.9, Ø 7.9, 2 x 2, 7.9 x 1.2
Optional (524-061):[mm]: Ø 0.1, Ø 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: Ø 3.9, Ø 7.9, 11.8 x 2, 2 x 2
Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual measurement.Spot size is shown in the video image.
Smallest measurement spot: approx.
Ø 0.1 mm (3.9 mils) with aperture 0.05 x 0.05 mm (2 x 2 mils) X-Ray DetectionX-ray detector:Proportional counter tube
Measuring distance:0 … 80 mm (0 … 3.2 in)
Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy anadditional calibration might be necessary.
Sample AlignmentSample positioning:Manually
Video microscope:High-resolution CCD colour camera for optical monitoring of the measurement locationalong the primary beam axis, manual focusing and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator, adjustable LED illumination,laser pointer (class 1) to support accurate sample placement.
Zoom factor:Digital 1x, 2x, 3x, 4x
Evaluation UnitComputer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT Optional: Fischer WinFTM® BASIC, PDM®, SUPER
