X Ray Fluorescence Measuring Instrument

X-Ray Fluorescence Measuring Instrument : XDLM

X-Ray Fluorescence Measuring Instrument : XDLM
Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations.
MODELSXDLM 231: Plane support stage, motor-driven Z-axis
XDLM 232: Manually operable XY-stage, motor-driven Z-axis
XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis
TYPICAL FIELDS OF APPLICATIONMeasurement of electroplated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on printed circuit boards
General SpecificationIntended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to
determine thin coatings, small structures and alloys.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.

Design:Bench top unit with upwards opening hood

Measuring direction:Top down

X-Ray SourceX-ray tube:Micro-focus tungsten tube with beryllium window

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):4x changeable

Standard (523-440):[mm]: Ø 0.1, Ø 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: Ø 3.9, Ø 7.9, 2 x 2, 7.9 x 1.2

Optional (523-366):[mm]: Ø 0.1, Ø 0.2, Ø 0.3, 0.3 x 0.05; [mils]: Ø 3.9, Ø 7.9, Ø 11.8, 11.8 x 2

Optional (524-061):[mm]: Ø 0.1, Ø 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: Ø 3.9, Ø 7.9, 11.8 x 2, 2 x 2

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.

Smallest measurement spot: approx.

Ø 0.1 mm (3.9 mils) with aperture
0.05 x 0.05 mm (2 x 2 mils)
X-Ray DetectionX-ray detector:Proportional counter tube

Measuring distance:0 … 80 mm (0 … 3.2 in)

Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.

Sample AlignmentSample positioning:Manually

Video microscope:High-resolution CCD colour camera for optical monitoring of the
measurement locationalong the primary beam axis, manual focusing
and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator,
adjustable LED illumination,laser pointer (class 1) to support accurate
sample placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Evaluation UnitComputer:Windows®-PC

Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER

Provide Us More Details
Purpose of Requirement:

Reselling End Use Raw Material


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    Rakesh Bhan

    (Managing Director)

    Fischer Measurement Technologies India Private Limited

    Hinjawadi, Pune, Maharashtra, India

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