New Items Coating Thickness Gauge DUALSCOPE DMP20Ask PriceDMP Series Gauge family for measuring coating thickness. Base material electrically conductive (NF) Paint, varnish, plastic coating on Al, Cu or Brass (NC/NF) Anodized...DMP Series Gauge family for measuring coating thickness.Base material electrically conductive (NF) Paint, varnish, plastic coating on Al, Cu or Brass (NC/NF) Anodized coating on Al (NC/NF)Base material steel or iron (FE) Zn, Cr, Cu coating on steel or iron (NF/FE) Paint, varnish, plastic coating on steel or iron (NC/FE)Features ∙ Universal device series for tactile coating thickness measurement thanks to enormously wide probe portfolio ∙Test method: Amplitudesensitive eddy current method ∙ Measured value memory: DMP20: 10,000 in one batch, DMP40: 250,000 in 2,500 batches ∙ Measurement range: Depending on the combination of coating and base material and the used probe ∙ Robust aluminum housing with protection class IP64 ∙ Replaceable Li-Ion battery for > 24 h operating time ∙ Easy data transfer via USB-C and Bluetooth ∙ Limit monitoring via light, sound and vibration ∙ Digital and analog probes available for various applicationsknow more2854160568991Get Best PriceCall Now FISCHER FERITSCOPE DMP30Ask PriceModel Name/Number: FISCHER FERITSCOPE DMP30Usage/Application: IndustrialPackaging Type: BOX Model Name/Number: FISCHER FERITSCOPE DMP30Usage/Application: IndustrialPackaging Type: BOX FISCHER FERITSCOPE DMP30. The advantages of these robust handheld devices...FISCHER FERITSCOPE DMP30.The advantages of these robust handheld devices are particularly notable in chemical plants, power plants, and process engineering plants. They are ideally suited for onsite measurements of austenitic claddings as well as weld seams in stainless steel pipes, containers, boilers or other products made of austenitic or duplex steel. From a plating thickness of 3mm, ferrite content determination can be carried out reliably and precisely, regardless of the properties of the base material.The DMP Series is extremely durable, measures accurately and offers more:Robust. Full aluminum casing with IP64Soft bumper against drops of up to 1 mtrScratch and chemical resistant Gorilla GlassPrecise. Developed inhouse for demanding measurements and highest quality standardsOutstanding repeatabilityDigital Probes with IP65F-adapter for our proven analogue probesMore. Multisensory feedback via LED, sound and vibrationErrgonomic designLI-Batteries with up to 24 h runtimeUSB-C and BluetoothNew, innovative softwareEasy data transfer, evaluation and exportEasy creation of reports and protocolsExtensive range of accessoriesProfessional Serviceknow more2850946958033Get Best PriceCall Now Wafer Coating Thickness Instrument : Xuv 773Ask PriceBrand: FischerUsage/Application: IndustrialPower Supply: AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 HzDimension: 660 x 835 x 720 mm Brand: FischerUsage/Application: IndustrialPower Supply: AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 HzX Ray Standards: DIN ISO 3497 and ASTM B 568Dimension: 660 x 835 x 720 mmHigh Voltage: Three steps 10 kV,40 kV,50 kVProtection Class: IP40 Wafer coating thickness instrument - XUV 773 is one of the most preferred selections of clients owing to its precise design and outstanding accuracy. These are high performance X-ray fluorescence measuring instrument with vacuum chamber for non-destructive coating thickness measurement and material analysis. Engineered in accordance with international industrial standard, these devices are widely used for non-destructive analysis of thin coatings, traces and light elements. Up to 24 elements in the range of sodium (11) to uranium (92) can be determined simultaneously. Ergonomically designed these devices also provide facility for the measurement that it can be performed in vacuum, in ambient air or with helium purge (optional). Therefore also organic or wet samples can be analyzed. EN 61010X-Ray standards:DIN ISO 3497 and ASTM B 568Approval:Individual acceptance inspection as a fully protected instrument according to the German regulations „Deutsche Röntgenverordnung-RöV“.know more10220569548Get Best PriceCall Now Gold Testing Machines For Hallmarking CentresAsk PriceCondition: NewOperation Mode: AutomaticModel: XDV-SDDBrand: FischerMax travel speed: 60 mm/s (0.2 ft/s)Max sample height: 140 mm (5.5 in) Condition: NewOperation Mode: AutomaticModel: XDV-SDDBrand: FischerMax travel speed: 60 mm/s (0.2 ft/s)Max sample height: 140 mm (5.5 in)Power: High voltage Three steps 10 kV, 30 kV, 50 kV Delivery Time: 3 WeeksHallmarking centers gold testing machines are engineered in accordance with international industrial standard. These are available in various ranges including gold testing machine in hallmarking centres: XAN-FD, gold testing: XAN250, gold testing machine in hallmarking centres: XDAL237 and gold testing machine in hallmarking centres: XDV-SDD. Engineered under the firm direction of experienced quality controllers, these devices are acclaimed for longer service life, accurate measurement and effective performance.know more10218515197Get Best PriceCall Now Gold Testing Machine with Automatic MovementAsk PriceUsage/Application: Analysis of Gold,Silver and other precious metalsModel Number/Name: XDV-SDDAnalysis Elements: Silver, Platinum, Copper, GUsed Usage/Application: Analysis of Gold,Silver and other precious metalsModel Number/Name: XDV-SDDAnalysis Elements: Silver, Platinum, Copper, GUsedPower Type: ElectricOperation Mode: AutomaticAutomation Grade: AutomaticDimension: 403 x 588 x 365 mmBrand: FischerProtection Class: IP40Power Supply: AC 115 V or AC 230 V 50 / 60 HzRepeatability: Greater than 1 % for gold,measurement time 60 sec Delivery Time: 3 WeeksDelivery Time: 3 WeeksThe high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis.These have programmable XY-stage, which make these perfect for auto-mated sample measurements.These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy.These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage.These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement.These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement.These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloysElement range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneouslyDesign:Bench-top unit with hood opening upwards XY-stage and Z-axiselectrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sampleMeasuring direction:From top to bottomX-Ray Source X-ray tubeMicro focus tungsten tube with beryllium windowHigh voltageThree steps 10 kV, 30 kV, 50 kVAperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0,6 mm (23.6 mils), Ø 1 mm(39.4 mils),Ø 3 mm (118 mils), others on requestPrimary filter:6x changeable (Ni, free, Al 1000 μm (39.4 mils), Al 500 μm (19.7 mils),Al 100 μm (3.9 mils), Mylar® 100 μm (3.9 mils)Measurement spot size:Depending on measurement distance and aperture,Measurement spotsize ≈ aperture size + 10% The actual measurement spot size is shown in thevideo image.Smallest measurement spot: approx. Ø 0.25 mm (9.8 mils)know more11111886948Get Best PriceCall Now PVD And CVD Coating Thickness Gauge : XDV-SDDAsk PriceThe high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings....The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloysElement range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneouslyDesign:Bench-top unit with hood opening upwards XY-stage and Z-axiselectrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sampleMeasuring direction:From top to bottomknow more22221740888Get Best PriceCall Now
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