Fischer Measurement Technologies India Private Limited
Pune, Maharashtra
GST 27AAACF9487H1Z6
TrustSeal Verified
Approx. Rs 18 Lakh / Piece
Fischer Carat Meter are widely being used in Retail Jewellery Shops and Gold selling/ Exchange industry for getting accurate and fast result.
Fischer Carat Meter is used in the analysis of:
Classical gold alloys like yellow, red and green gold
• Modern white gold alloys and Rhodium coated gold and silver alloys
• Platinum alloys, if they do not contain gold
Gold and precious metal analysis in the jewellery and watch industries
• Analysis of dental alloys
• Yellow and white gold, Platinum and silver
• Rhodium
• Alloys and coatings.
Fischer Carat meter offers following advantages
1. Non-destructive with minimal sample preparartion required
2. Gold Content is displayed within 30 seconds to give you fast and accurate result.
3. Easy to determine alloy content such as Pt, Pd, Ag, or Cu in Gold.
4. Large Sample Volumes can be measured economically through a fully automated measurement run.
5. Check for local inhomogeneities through small measurement spots- even with complicated sample shapes.
6. User friendly handling- no chemical used.
7. Convineient documentation of the measurement results inculding sample image.
Approx. Rs 18 Lakh / Piece
GOLD PURITY TESTING MACHINE - GOLDSCOPE SD 510 - RETAIL STORES, JEWELLERS & BANKS
Goldscope SD 510 is a X-Ray Fluorescence Measuring gold testing instrument optimized for fast, cost-effective and non-destructive Analysis of jewellery, coins and precious metals for jewellery, retail store, banks and gold exchange.
Goldscope SD 510 can measure all the element from Aluminium to Uranium including the detection of PGM group elements such as Iridium, Ruthinuem, Osmium.
It comes with an advanced SI - PIN detector for high-precision analysis of precious metals.
X-Ray Fluorescence Measuring Instruments
Optimized for Fast, Cost-effective and Non-destructive
Analysis of Jewellery, Coins and Precious Metals
These are ideal to measure range of up to 22 mm. straightened with the integrated video-microscope with crosshairs and up to 184x zoom factor simplifies sample placement, these devices are very easy to install, operate and maintain.
TYPICAL AREAS OF APPLICATION ARE:Approx. Rs 28 Lakh / Piece
These are user-friendly bench-top instruments available in various housing size and support stage.
These are extensively recommended by clients owing to its quick and easy sample positioning.
The X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber.
These are straightened with the integrated video microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.
These are operated through the powerful and user-friendly Winftm® software.
The GOLDSCOPE SD 520 is designed as per DIN ISO 3497 and fulfills ASTM B 568 standard.
General Specification
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to
analyze precious metals and their alloys in composition and coating thickness.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously
Repeatability:≤ 0.5 ‰ for gold, measurement time 60 sec
Design:Bench-top unit with hood opening upwards
Measuring direction:Bottom-up
X-ray tubeMicro focus tungsten tube with beryllium window
High voltageThree steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)
Measurement spot:Aperture diameter plus 200 μm (8 mils), at measurement distance MD = 0mm
X-ray detectorSilicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-Kα)≤ 160 eV
Measurement distance:0 … 20 mm (0 … 0.8 in) Distance compensation with patented DCM method
for simplified measurements at varying distances. For particular applications
an additional calibration might be necessary.
Sample positioningManually
Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis,Crosshairs with a calibrated scale (ruler)
and spot-indicator,Adjustable LED illumination of the measurement location
Zoom factorDigital 1x, 2x, 3x, 4x
Approx. Rs 32 Lakh / Piece
Gold Testing Machine - GOLDSCOPE SD 550 DPP+ :
The high-end measurement system GOLDSCOPE SD 550 DPP+ was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. GOLDSCOPE SD 550 DPP+ is engineered using best available techniques. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.
Application :
Hallmarking Centre, Testing Centre, Assaying Offices, Gold Refineries.
DESIGN :
These are user friendly devices acclaimed for compact size and consistent performance.
Our devices are acclaimed for their quick and easy sample positioning and consistent performance.
These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.
Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly Winftm® software.
These are designed and developed in accordance with German regulations "Deutsche Röntgenverordnung-röv“.
General Specification
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)
to determine thin coatings and alloys
Element range:Aluminum (13) to Ura (92), up to 24 elements simultaneously
Design:Bench-top unit with hood opening upwards opening hood
Measuring direction:Bottom-up
X-ray tube:Micro focus tungsten tube with beryllium window
High voltage:Three steps 10 kV, 30 kV, 50 kV
Aperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils)
, Ø 2 mm (78.7 mils), others on request.
Primary filter:6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils);
Al 100 μm (3.9 mils); Mylar® 100 μm (3.9mils).
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement spot size is shown in the video image.Smallest measurement
spot: approx. Ø 0.3 mm (11.8 mils)
X-ray detector:Silicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-Kα):≤ 140 eV
Measurement distance:0 … 25 mm (0 … 1 in) Distance compensation with patented DCM method
for simplified measurements at varying distances. For particular applications
an additional calibration might be necessary.
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis,Crosshairs with a calibrated scale (ruler)
and spot-indicator,Adjustable LED illumination.
Zoom factor:Digital 1x, 2x, 3x, 4x
Approx. Rs 22 Lakh / Piece
These are widely known as a user-friendly bench-top instrument with quick and easy specimen positioning.
These are designed in such a way that its X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber, which ensure that the measuring direction is from underneath the sample, which is supported by a transparent window.
These provide precise measuring spot adjustment as these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample place.
Our machines are directed through powerful and user-friendly Winftm® software for the entire operation and evaluation of measurements as well as the clear presentation.
Our devices are Fully protected instrument with type approval according to the German regulations „Deutsche Röntgenverordnung-röv“ and designed as per DIN ISO 3497 and ASTM B 568 standard.
Intended use:Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and their alloys in composition and coating thickness.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously
Repeatability:≤ 1 ‰ for gold,measurement time 60 sec
Design:Bench top unit with towards the front opening hood
Measuring direction:Bottom up
X-ray tubeTungsten tube, thermally stabilized
High voltageThree steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils)
Measurement spot:Aperture diameter plus 200 μm (8 mils),at measurement distance MD= 0mm
X-ray detectorSilicon PIN detector with peltier cooling
Resolution (fwhm for Mn-Kα)≤ 180 eV
Measuring distance0 … 25 mm (0 … 1 in)
Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.
Sample positioningManually
Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis,Crosshairs with a calibrated scale (ruler)
and spot-indicator,Adjustable LED illumination
Zoom factorDigital 1x, 2x, 3x, 4x
DesignFixed sample support
Usable sample310 x 320 mm (12.2 x 12.6 in)
placement area
Max. sample weight13 kg (29 lb)
Max. sample height90 mm (3.5 in)
Ergonomically engineered user friendly device in compact size with longer service life
It is light in weight and requires less space for installation.
The door of measurement chamber does not open upwards, but towards the front which allow placing notebook for operation onto the instrument thus saves even more space.
The X-ray source and detector assembly is located in the instrument''s lower chamber for quick and easy sample positioning. It is also fitted with the integrated video-microscope with zoom and cross-hairs that simplifies sample placement and also allows a precise measuring spot adjustment.
The system runs on powerful and user-friendly WinFTM® software which ensure smooth operations and evaluation of measurements as well as the clear presentation of measurement data.
FEATURES:
Compact design, efficient, lightweight instrument (appr. 25 kg, 55 lb) and small footprint
Designed particularly for analysis of gold alloy at reasonable prices
Equipped with semiconductor detector that is also suitable for more complex analyses with other elements
The machine has been designed for quick and sampling position
TYPICAL FIELDS OF APPLICATIONS:
Intended use:Energy dispersive X-ray measuring instrument (EDXRF) to analyse precious
metals and their alloys in composition and coating thickness.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously
Repeatability:≤ 1 ‰ for gold, measurement time 60 sec
Design:Bench top unit with towards the front opening hood
Measuring direction:Bottom up
X-Ray Source
X-ray tube:Tungsten tube, thermally stabilized
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 1 mm (39 mils)
Measurement spot:Aperture diameter plus 200 μm (8 mils),at measurement distance MD= 0mm
The high-end measurement system GOLDSCOPE SD 550 was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.
GOLDSCOPE SD 550 is on of the highest selling gold testing machine extensively being used in hallmarking and testing centre. Along with gold, silver and platinum it can also detect PGM group elements such as Iridium, Ruthenium and Osmium.
These are user friendly devices acclaimed for compact size and consistent performance.Our devices are acclaimed for their quick and easy sample positioning and consistent performance.
These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.
Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly Winftm® software.
These are designed and developed in accordance with German regulations "Deutsche Röntgenverordnung-röv“.
General Specification
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys analysis.
Element range:Aluminum (13) to Uranium (92), up to 24 elements simultaneously
Design:Bench-top unit with hood opening upwards opening hood
Measuring direction:Bottom-up
X-ray tube:Micro focus tungsten tube with beryllium window
High voltage:Three steps 10 kV, 30 kV, 50 kV
Aperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils)
, Ø 2 mm (78.7 mils), others on request.
Primary filter:6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils);
Al 100 μm (3.9 mils); Mylar® 100 μm (3.9mils).
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement spot size is shown in the video image.Smallest measurement
spot: approx. Ø 0.3 mm (11.8 mils)
X-ray detector:Silicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-Kα):≤ 160 eV
Measurement distance:0 … 25 mm (0 … 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications an additional calibration might be necessary.
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,Crosshairs with a calibrated scale (ruler) and spot-indicator,Adjustable LED illumination.
Zoom factor:Digital 1x, 2x, 3x, 4x
Sample support stageDesignFixed sample supportManual Operable X/Y-stage
Usable sample placement area310 x 320 mm (12.2 x 12.6 in)310 x 320 mm (12.2 x 12.6 in)
Max. sample weight13 kg (29 lb)2 kg (4.4 lb)
Max. sample height90 mm (3.5 in)174 mm (6.8 in)
Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.
These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.
These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to
analyze precious metals and their alloys in composition and coating thickness.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously
Repeatability:≤ 0.5 ‰ for gold, measurement time 60 sec
Design:Bench-top unit with hood opening upwards
Measuring direction:Bottom-up
X-ray tubeMicro focus tungsten tube with beryllium window
High voltageThree steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)
Measurement spot:Aperture diameter plus 200 μm (8 mils), at measurement distance MD = 0mm
X-ray detectorSilicon Drift Detector (SDD), peltier-cooled
Resolution (fwhm for Mn-Kα)≤ 160 eV
Measurement distance:0 … 20 mm (0 … 0.8 in) Distance compensation with patented DCM method
for simplified measurements at varying distances. For particular applications
an additional calibration might be necessary.
Sample positioningManually
Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis,Crosshairs with a calibrated scale (ruler)
and spot-indicator,Adjustable LED illumination of the measurement location
Zoom factorDigital 1x, 2x, 3x, 4x
DesignFixed sample supportManual operable X/Y-stage
Usable sample placement area310 x 320 mm (12.2 x 12.6 in)310 x 320 mm (12.2 x 12.6 in)
Max. sample weight13 kg (29 lb)2 kg (4.4 lb)
Max. sample height90 mm (3.5 in)174 mm (6.8 in)
Power supplyAC 115 V or AC 230 V 50 / 60 Hz
Power consumptionMax. 120 W, without evaluation PC
Protection classIP40
External dimensions
Width x depth x height [mm]403 x 588 x 365 mm403 x 588 x 444 mm
(16 x 23.2 x 14.4 in)(16 x 23.2 x 17.5 in)
WeightApprox. 45 kg (99 lb)Approx. 45 kg (99 lb)
Temperature: Operation10 °C – 40 °C / 50 °F – 104 °F
Temperature:0 °C – 50 °C / 32 °F – 122 °F
Storage/Transport
Admissible air humidity≤ 95 %, non-condensing
FISCHERSCOPE® X-RAY XDAL® 237 are widely X-ray fluorescence measuring instrument with a programmable XY-stage and Z-axis for automated precious metal analysis in jewellery industry. These are widely used for non-destructive measurements and analysing very thin coatings.
DESIGN
These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically.
These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened.
These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured.
These are operated through the powerful and user-friendly Winftm® software and designed as per German regulations „Deutsche Röntgen verordnung-röv“. Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software.
General Specification
Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)
to determine thin coatings and alloys
Element range:Aluminum Al (13) to urn U (92) – up to 24 elements simultaneously
Design:Bench-top unit with hood opening upwards XY-stage and Z-axis
electrically driven and programmable,Motor-driven changeable apertures
and filters Video camera and laser pointer (class 1) for orienting the sample
Measuring direction:Top down
X-ray tubeMicro focus tungsten tube with beryllium window
High voltageThree steps 10 kV, 30 kV, 50 kV
Aperture (Collimator):4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm
(23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request
Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
spot size is shown in the video image. Smallest measurement
approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)
X-ray detectorSilicon PIN detector with peltier cooling
Resolution (fwhm for Mn-Kα)≤ 200 eV
Measurement distance:0 … 80 mm (0 … 3.2 in) Distance compensation with patented DCM method
for simplified measurements at varying distances. For particular applications
or for higher demands on accuracy an additional calibration might be
necessary.
Video microscope High-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis,manual focusing and auto-focus,
crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED
illumination, laser pointer (class 1) to support accurate sample placement.
Zoom factor Digital 1x, 2x, 3x, 4x
We will contact you soon !
Rakesh Bhan
(Managing Director)
Fischer Measurement Technologies India Private Limited
Hinjawadi, Pune,
Maharashtra,
India