Fischer Carat Meter are widely being used in Retail Jewellery Shops and Gold selling/ Exchange industry for getting accurate and fast result.

Fischer Carat Meter is used in the analysis of:

Classical gold alloys like yellow, red and green gold

• Modern white gold alloys and Rhodium coated gold and silver alloys

• Platinum alloys, if they do not contain gold

Gold and precious metal analysis in the jewellery and watch industries

• Analysis of dental alloys

• Yellow and white gold, Platinum and silver

• Rhodium

• Alloys and coatings.

Fischer Carat meter offers following advantages

1. Non-destructive with minimal sample preparartion required

2. Gold Content is displayed within 30 seconds to give you fast and accurate result.

3. Easy to determine alloy content such as Pt, Pd, Ag, or Cu in Gold.

4. Large Sample Volumes can be measured economically through a fully automated measurement run.

5. Check for local inhomogeneities through small measurement spots- even with complicated sample shapes.

6. User friendly handling- no chemical used.

7. Convineient documentation of the measurement results inculding sample image.

GOLD PURITY TESTING MACHINE - GOLDSCOPE SD 510 - RETAIL STORES, JEWELLERS & BANKS

Goldscope SD 510 is a X-Ray Fluorescence Measuring gold testing  instrument optimized for fast, cost-effective and non-destructive Analysis of jewellery, coins and precious metals for jewellery, retail store, banks and gold exchange.

Goldscope SD 510 can measure all the element from Aluminium to Uranium including the detection of PGM group elements such as Iridium, Ruthinuem, Osmium.

It comes with an advanced SI - PIN detector for high-precision analysis of precious metals.

X-Ray Fluorescence Measuring Instruments

Optimized for Fast, Cost-effective and Non-destructive

Analysis of Jewellery, Coins and Precious Metals

These are user-friendly bench-top instruments available in various housing size and support stage.

These are extensively recommended by clients owing to its quick and easy sample positioning.

The X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber.

These are straightened with the integrated video microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.

These are operated through the powerful and user-friendly Winftm® software.

The GOLDSCOPE SD 520 is designed as per DIN ISO 3497 and fulfills ASTM B 568 standard.

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to

 analyze precious metals and their alloys in composition and coating thickness.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously

Repeatability:≤ 0.5 ‰ for gold, measurement time 60 sec

Design:Bench-top unit with hood opening upwards

Measuring direction:Bottom-up

X-ray tubeMicro focus tungsten tube with beryllium window

High voltageThree steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)

Measurement spot:Aperture diameter plus 200 μm (8 mils), at measurement distance MD = 0mm

X-ray detectorSilicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα)≤ 160 eV

Measurement distance:0 … 20 mm (0 … 0.8 in) Distance compensation with patented DCM method

 for simplified measurements at varying distances. For particular applications

 an additional calibration might be necessary.

Sample positioningManually

Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement

 location along the primary beam axis,Crosshairs with a calibrated scale (ruler)

 and spot-indicator,Adjustable LED illumination of the measurement location

Zoom factorDigital 1x, 2x, 3x, 4x

Gold Testing Machine - GOLDSCOPE SD 550 DPP+ :

The high-end measurement system GOLDSCOPE SD 550 DPP+ was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. GOLDSCOPE SD 550 DPP+ is engineered using best available techniques. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.

Application :
Hallmarking Centre, Testing Centre, Assaying Offices, Gold Refineries.

DESIGN :
These are user friendly devices acclaimed for compact size and consistent performance.

Our devices are acclaimed for their quick and easy sample positioning and consistent performance.

These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.

Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly Winftm® software.

These are designed and developed in accordance with German regulations "Deutsche Röntgenverordnung-röv“.

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)

  to determine thin coatings and alloys

Element range:Aluminum (13) to Ura (92), up to 24 elements simultaneously

Design:Bench-top unit with hood opening upwards opening hood

Measuring direction:Bottom-up

X-ray tube:Micro focus tungsten tube with beryllium window

High voltage:Three steps 10 kV, 30 kV, 50 kV

Aperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils)

 , Ø 2 mm (78.7 mils), others on request.

Primary filter:6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils);

 Al 100 μm (3.9 mils); Mylar® 100 μm (3.9mils).

Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement spot size is shown in the video image.Smallest measurement

 spot: approx. Ø 0.3 mm (11.8 mils)

X-ray detector:Silicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα):≤ 140 eV

Measurement distance:0 … 25 mm (0 … 1 in) Distance compensation with patented DCM method

 for simplified measurements at varying distances. For particular applications

 an additional calibration might be necessary.

Sample positioning:Manually

Video microscope:High-resolution CCD color camera for optical monitoring of the measurement

 location along the primary beam axis,Crosshairs with a calibrated scale (ruler)

 and spot-indicator,Adjustable LED illumination.

Zoom factor:Digital 1x, 2x, 3x, 4x

These are widely known as a user-friendly bench-top instrument with quick and easy specimen positioning.

These are designed in such a way that its X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber, which ensure that the measuring direction is from underneath the sample, which is supported by a transparent window.

These provide precise measuring spot adjustment as these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample place.

Our machines are directed through powerful and user-friendly Winftm® software for the entire operation and evaluation of measurements as well as the clear presentation.

Intended use:Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and their alloys in composition and coating thickness.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously

Repeatability:≤ 1 ‰ for gold,measurement time 60 sec

Design:Bench top unit with towards the front opening hood

Measuring direction:Bottom up

X-ray tubeTungsten tube, thermally stabilized

High voltageThree steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils)

Measurement spot:Aperture diameter plus 200 μm (8 mils),at measurement distance MD= 0mm

X-ray detectorSilicon PIN detector with peltier cooling

Resolution (fwhm for Mn-Kα)≤ 180 eV

Measuring distance0 … 25 mm (0 … 1 in)

 Distance compensation with patented DCM method for simplified

 measurements at varying distances. For particular applications or for

 higher demands on accuracy anadditional calibration might be necessary.

Sample positioningManually

Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement

 location along the primary beam axis,Crosshairs with a calibrated scale (ruler)

 and spot-indicator,Adjustable LED illumination

Zoom factorDigital 1x, 2x, 3x, 4x

DesignFixed sample support

Usable sample310 x 320 mm (12.2 x 12.6 in)

placement area

Max. sample weight13 kg (29 lb)

Max. sample height90 mm (3.5 in)

These are ideal to measure range of up to 22 mm. straightened with the integrated video-microscope with crosshairs and up to 184x zoom factor simplifies sample placement, these devices are very easy to install, operate and maintain.

• Analysis of Jewellery
• Determination of Iridium, Ruthenium
• Tunch centre
• Analysis of alloys in the jewellery and watch industries
• Research in universities and in the industries

Ergonomically engineered user friendly device in compact size with longer service life

It is light in weight and requires less space for installation.

The door of measurement chamber does not open upwards, but towards the front which allow placing notebook for operation onto the instrument thus saves even more space.

The X-ray source and detector assembly is located in the instrument''s lower chamber for quick and easy sample positioning. It is also fitted with the integrated video-microscope with zoom and cross-hairs that simplifies sample placement and also allows a precise measuring spot adjustment.

The system runs on powerful and user-friendly WinFTM® software which ensure smooth operations and evaluation of measurements as well as the clear presentation of measurement data.

Compact design, efficient, lightweight instrument (appr. 25 kg, 55 lb) and small footprint

Designed particularly for analysis of gold alloy at reasonable prices

Equipped with semiconductor detector that is also suitable for more complex analyses with other elements

The machine has been designed for quick and sampling position

• Jewellery, precious metals and dental alloys
• Yellow and white gold
• Platinum and silver
• Rhodium
• Alloys and coatings
• Multi layer coatings

Intended use:Energy dispersive X-ray measuring instrument (EDXRF) to analyse precious

metals and their alloys in composition and coating thickness.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously

Repeatability:≤ 1 ‰ for gold, measurement time 60 sec

Design:Bench top unit with towards the front opening hood

Measuring direction:Bottom up

X-ray tube:Tungsten tube, thermally stabilized

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):Ø 1 mm (39 mils)

Measurement spot:Aperture diameter plus 200 μm (8 mils),at measurement distance MD= 0mm

The high-end measurement system GOLDSCOPE SD 550 was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.

GOLDSCOPE SD 550 is on of the highest selling gold testing machine extensively being used in hallmarking and testing centre. Along with gold, silver and platinum it can also detect PGM group elements such as Iridium, Ruthenium and Osmium.

These are user friendly devices acclaimed for compact size and consistent performance.Our devices are acclaimed for their quick and easy sample positioning and consistent performance.

These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.

Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly Winftm® software.

These are designed and developed in accordance with German regulations "Deutsche Röntgenverordnung-röv“.

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys analysis.

Element range:Aluminum (13) to Uranium (92), up to 24 elements simultaneously

Design:Bench-top unit with hood opening upwards opening hood

Measuring direction:Bottom-up

X-ray tube:Micro focus tungsten tube with beryllium window

High voltage:Three steps 10 kV, 30 kV, 50 kV

Aperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0.6 mm (23.6 mils), Ø 1 mm (39.4 mils)

, Ø 2 mm (78.7 mils), others on request.

Primary filter:6x changeable: Ni, free, Al 1000 μm (39.4 mils); Al 500 μm (19.7 mils);

Al 100 μm (3.9 mils); Mylar® 100 μm (3.9mils).

Measurement spot:Depending on the measuring distance and on the aperture, the actual

measurement spot size is shown in the video image.Smallest measurement

spot: approx. Ø 0.3 mm (11.8 mils)

X-ray detector:Silicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα):≤ 160 eV

Measurement distance:0 … 25 mm (0 … 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications an additional calibration might be necessary.

Sample positioning:Manually

Video microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,Crosshairs with a calibrated scale (ruler) and spot-indicator,Adjustable LED illumination.

Zoom factor:Digital 1x, 2x, 3x, 4x

DesignFixed sample supportManual Operable X/Y-stage

Usable sample placement area310 x 320 mm (12.2 x 12.6 in)310 x 320 mm (12.2 x 12.6 in)

Max. sample weight13 kg (29 lb)2 kg (4.4 lb)

Max. sample height90 mm (3.5 in)174 mm (6.8 in)

Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.

These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.

These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to

 analyze precious metals and their alloys in composition and coating thickness.

Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously

Repeatability:≤ 0.5 ‰ for gold, measurement time 60 sec

Design:Bench-top unit with hood opening upwards

Measuring direction:Bottom-up

X-ray tubeMicro focus tungsten tube with beryllium window

High voltageThree steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):Ø 1 mm (39 mils), optional Ø 2 mm (79 mils) or Ø 0.6 mm (23.6 mils)

Measurement spot:Aperture diameter plus 200 μm (8 mils), at measurement distance MD = 0mm

X-ray detectorSilicon Drift Detector (SDD), peltier-cooled

Resolution (fwhm for Mn-Kα)≤ 160 eV

Measurement distance:0 … 20 mm (0 … 0.8 in) Distance compensation with patented DCM method

 for simplified measurements at varying distances. For particular applications

 an additional calibration might be necessary.

Sample positioningManually

Video microscopeHigh-resolution CCD color camera for optical monitoring of the measurement

 location along the primary beam axis,Crosshairs with a calibrated scale (ruler)

 and spot-indicator,Adjustable LED illumination of the measurement location

Zoom factorDigital 1x, 2x, 3x, 4x

DesignFixed sample supportManual operable X/Y-stage

Usable sample placement area310 x 320 mm (12.2 x 12.6 in)310 x 320 mm (12.2 x 12.6 in)

Max. sample weight13 kg (29 lb)2 kg (4.4 lb)

Max. sample height90 mm (3.5 in)174 mm (6.8 in)

Power supplyAC 115 V or AC 230 V 50 / 60 Hz

Power consumptionMax. 120 W, without evaluation PC

Protection classIP40

External dimensions
Width x depth x height [mm]403 x 588 x 365 mm403 x 588 x 444 mm

 (16 x 23.2 x 14.4 in)(16 x 23.2 x 17.5 in)

WeightApprox. 45 kg (99 lb)Approx. 45 kg (99 lb)

Temperature: Operation10 °C – 40 °C / 50 °F – 104 °F

Temperature:0 °C – 50 °C / 32 °F – 122 °F

Storage/Transport

Admissible air humidity≤ 95 %, non-condensing

FISCHERSCOPE® X-RAY XDAL® 237  are widely  X-ray fluorescence measuring instrument with a programmable XY-stage and Z-axis for automated precious metal analysis in jewellery industry. These are widely used for non-destructive measurements and analysing very thin coatings.

These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically.

These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened.

These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured.

These are operated through the powerful and user-friendly Winftm® software and designed as per German regulations „Deutsche Röntgen verordnung-röv“. Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software.

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)

to determine thin coatings and alloys

Element range:Aluminum Al (13) to urn U (92) – up to 24 elements simultaneously

Design:Bench-top unit with hood opening upwards XY-stage and Z-axis

electrically driven and programmable,Motor-driven changeable apertures

and filters Video camera and laser pointer (class 1) for orienting the sample

Measuring direction:Top down

X-ray tubeMicro focus tungsten tube with beryllium window

High voltageThree steps 10 kV, 30 kV, 50 kV

Aperture (Collimator):4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm

(23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot:Depending on the measuring distance and on the aperture, the actual

spot size is shown in the video image. Smallest measurement

approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)

X-ray detectorSilicon PIN detector with peltier cooling

Resolution (fwhm for Mn-Kα)≤ 200 eV

Measurement distance:0 … 80 mm (0 … 3.2 in) Distance compensation with patented DCM method

for simplified measurements at varying distances. For particular applications

or for higher demands on accuracy an additional calibration might be

necessary.

Video microscope High-resolution CCD color camera for optical monitoring of the measurement

location along the primary beam axis,manual focusing and auto-focus,

crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED

illumination, laser pointer (class 1) to support accurate sample placement.

Zoom factor Digital 1x, 2x, 3x, 4x