Gold Testing Machine Gold Testing Machines For Hallmarking CentresAsk PriceCondition: NewOperation Mode: AutomaticModel: XDV-SDDBrand: FischerMax travel speed: 60 mm/s (0.2 ft/s)Max sample height: 140 mm (5.5 in) Condition: NewOperation Mode: AutomaticModel: XDV-SDDBrand: FischerMax travel speed: 60 mm/s (0.2 ft/s)Max sample height: 140 mm (5.5 in)Power: High voltage Three steps 10 kV, 30 kV, 50 kV Delivery Time: 3 WeeksHallmarking centers gold testing machines are engineered in accordance with international industrial standard. These are available in various ranges including gold testing machine in hallmarking centres: XAN-FD, gold testing: XAN250, gold testing machine in hallmarking centres: XDAL237 and gold testing machine in hallmarking centres: XDV-SDD. Engineered under the firm direction of experienced quality controllers, these devices are acclaimed for longer service life, accurate measurement and effective performance.know more10218515197Get Best PriceCall Now Gold Testing Machine with Automatic MovementAsk PriceUsage/Application: Analysis of Gold,Silver and other precious metalsModel Number/Name: XDV-SDDAnalysis Elements: Copper, GUsed, Platinum, Silver Usage/Application: Analysis of Gold,Silver and other precious metalsModel Number/Name: XDV-SDDAnalysis Elements: Copper, GUsed, Platinum, SilverPower Type: ElectricOperation Mode: AutomaticAutomation Grade: AutomaticDimension: 403 x 588 x 365 mmBrand: FischerRepeatability: Greater than 1 % for gold,measurement time 60 secProtection Class: IP40Power Supply: AC 115 V or AC 230 V 50 / 60 Hz Delivery Time: 3 WeeksDelivery Time: 3 WeeksThe high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis.These have programmable XY-stage, which make these perfect for auto-mated sample measurements.These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy.These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage.These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement.These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement.These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloysElement range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneouslyDesign:Bench-top unit with hood opening upwards XY-stage and Z-axiselectrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sampleMeasuring direction:From top to bottomX-Ray Source X-ray tubeMicro focus tungsten tube with beryllium windowHigh voltageThree steps 10 kV, 30 kV, 50 kVAperture (Collimator):4x changeable: Ø 0.2 mm (7.9 mils), Ø 0,6 mm (23.6 mils), Ø 1 mm(39.4 mils),Ø 3 mm (118 mils), others on requestPrimary filter:6x changeable (Ni, free, Al 1000 μm (39.4 mils), Al 500 μm (19.7 mils),Al 100 μm (3.9 mils), Mylar® 100 μm (3.9 mils)Measurement spot size:Depending on measurement distance and aperture,Measurement spotsize ≈ aperture size + 10% The actual measurement spot size is shown in thevideo image.Smallest measurement spot: approx. Ø 0.25 mm (9.8 mils)know more11111886948Get Best PriceCall Now
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