These are available in two different range including XAN 250 and XAN 252.

These are user friendly devices acclaimed for compact size and consistent performance.

Our devices are acclaimed for their quick and easy sample positioning and consistent performance.

These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.

Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly WinFTM® software.

These are designed and developed in accordance with German regulations "Deutsche Röntgenverordnung-röv“.

Measurement of functional coatings, starting from a few nanometers

Electronics and semiconductor industries

Trace analysis for consumer protection, e.g. Lead content in toys

Analysis of alloys with highest requirements of accuracy in the jewelry and watch

Industries and in metal refineries

Research in universities and in the industries

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)

  to determine thin coatings and alloys

Element range:Aluminum (13) to Uranium (92), up to 24 elements simultaneously

Design:Bench-top unit with hood opening upwards opening hood

Measuring direction:Bottom-up