Software Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568

Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)

Measurements of functional coatings in the electronics and semiconductor industries

XDLM-PCB 210 and 220: Automated measurements, e.g., in quality control

Determining the composition of electroplating baths

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)

 to determine thin coatings, small structures and alloys.

Element range:Chlorine (17) to Uranium U (92) – up to 24 elements simultaneously.

Design:Bench-top unit with housing with a slot on the side

Measuring direction:Top down

X-ray tube:

High voltage:Three steps: 30 kV, 40 kV, 50 kV

Aperture (Collimator):XDLM-PCB 200/210: Ø 0.1 mm (3.9 mils), optional Ø 0.2 mm (7.9 mils),

 slot 0.3 x 0.05 mm (11.8 x 2 mils)

 Standard (523-440): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm

 (2 x 2 mils); 0.2 x 0.03 mm (7.9 x 1.2 mils)

 Optional (523-366): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8

 mils); 0.3 x 0.05 mm (11.8 x 2 mils)

Measurement spot:Depending on the measuring distance and on the aperture, the actual

 measurement.Spot size is shown in the video image.

 Smallest measurement spot:approx. Ø 0.2 mm (7.9 mils)

Measurement distance:0 … 10 mm (0 … 0.4 in) Distance compensation with patented DCM for

 simplified measurements at varying distances.For particular applications

 or for higher demands on accuracy an additional calibration might be

 necessary.

X-ray detector:Proportional counter tube

Sample positioning:Manually

Video microscope:High-resolution CCD color camera for optical monitoring of the

 measurement location along the primary beam axis, Manual

 focusing and auto-focus, Crosshairs with a calibrated scale

 (ruler) and spot-indicator, Adjustable LED illumination,Laser

 pointer (class 1) to support accurate,specimen placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Computer:Windows®-PC

Software:Standard: Fischer WinFTM® LIGHT

 Optional: Fischer WinFTM® BASIC, PDM®, SUPER

1. FISCHERSCOPE® X-RAY XAN® 500

The PICODENTOR® HM500 is an automated nanoindentation measuring system and

employs the instrumented indentation test method according to ISO 14577 and ASTM

E2546. The instrument allows for sophisticated measuring applications with difficult

positioning and is perfectly suitable for measurements in development, quality assurance,

incoming inspection and process control.

Typical fields of application

• Hard material coatings and ultra-thin

DLC coatings

• Dirt-repellent coatings

(e. g., Sol-Gel coatings)

• Super-thin paint coatings

• Ion-implanted surfaces

• Nano-coatings on sensors

• Implants/medical applications

• Matrix effects in alloys

• Biological materials

• Ceramic materials

• Hardness determination on microsections

• Automated measurements on multiple

samples

• Coatings on PC hard disks/CDs

Measurable characteristic material quantities

Material characteristics computed according to ISO 14577:

• Martens hardness HM

• Indentation hardness HIT (convertible to

HV)

• Modulus of indentation EIT

• Percent elastic portion ??IT of the indentation

work Welast/Wtotal

• Indentation creep CIT

• ESP – mode, partial load and unload

measurements, for depth-dependant

determination of quantities like EIT, HIT