Coating Thickness Edxrf Fischer XRF AnalyzerAsk PriceBrand: FischerDimension: 403 x 588 x 444 mmWeight: Approx 45 kgPower Supply: AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 Hz Brand: FischerDimension: 403 x 588 x 444 mmWeight: Approx 45 kgPower Supply: AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 HzApplication/Usage: IndustrialProtection Class: IP40 These are extensively acknowledged as specific X-ray fluorescence measuring instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are acclaimed for its longer service life and outstanding accuracy.Software Used : WinFTM®Design Standards : DIN ISO 3497 and ASTM B 568 TYPICAL FIELDS OF APPLICATION Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)Measurements of functional coatings in the electronics and semiconductor industriesXDLM-PCB 210 and 220: Automated measurements, e.g., in quality controlDetermining the composition of electroplating baths General Specification Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys.Element range:Chlorine (17) to Uranium U (92) – up to 24 elements simultaneously.Design:Bench-top unit with housing with a slot on the sideMeasuring direction:Top downX-Ray Source X-ray tube:High voltage:Three steps: 30 kV, 40 kV, 50 kVAperture (Collimator):XDLM-PCB 200/210: Ø 0.1 mm (3.9 mils), optional Ø 0.2 mm (7.9 mils), slot 0.3 x 0.05 mm (11.8 x 2 mils) Standard (523-440): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils); 0.2 x 0.03 mm (7.9 x 1.2 mils) Optional (523-366): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils); 0.3 x 0.05 mm (11.8 x 2 mils)Measurement spot:Depending on the measuring distance and on the aperture, the actual measurement.Spot size is shown in the video image. Smallest measurement spot:approx. Ø 0.2 mm (7.9 mils)Measurement distance:0 … 10 mm (0 … 0.4 in) Distance compensation with patented DCM for simplified measurements at varying distances.For particular applications or for higher demands on accuracy an additional calibration might be necessary. X-Ray Detection X-ray detector:Proportional counter tubeSample Alignment Sample positioning:ManuallyVideo microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis, Manual focusing and auto-focus, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination,Laser pointer (class 1) to support accurate,specimen placement.Zoom factor:Digital 1x, 2x, 3x, 4xEvaluation Unit Computer:Windows®-PCSoftware:Standard: Fischer WinFTM® LIGHT Optional: Fischer WinFTM® BASIC, PDM®, SUPERDimensions DimensionsXDLM-PCB 200XDLM-PCB 210External dimensions610 x 750 x 450 mmWith maximum XY travel range:1000 x 1265 x 470 mm(39.4 x 49.8 x 18.5 in)Width x depth x heightWith extension:1200 x 1050 x 450 mm(47.2 x 41.3 x 17.7 in)XY table retracted in home position:650 x 810 x 470 mm(25.6 x 31.9 x 18.5 in)WeightApprox. 86 kg (190 lb)Approx. 86 kg (190 lb)know more11089227291Get Best PriceCall Now Micro HardnessAsk PriceAutomation Grade: AutomaticBrand: FischerX Ray Standards: DIN ISO 3497 and ASTM B 568Application: IndustrialProtection Class: IP40Dimension: 403 x 588 x 444 mm Minimum Order Quantity: 1 PieceAutomation Grade: AutomaticBrand: FischerX Ray Standards: DIN ISO 3497 and ASTM B 568Application: IndustrialProtection Class: IP40Dimension: 403 x 588 x 444 mm Delivery Time: 4 WeeksThe PICODENTOR® HM500 is an automated nanoindentation measuring system andemploys the instrumented indentation test method according to ISO 14577 and ASTME2546. The instrument allows for sophisticated measuring applications with difficultpositioning and is perfectly suitable for measurements in development, quality assurance,incoming inspection and process control.Typical fields of application• Hard material coatings and ultra-thinDLC coatings• Dirt-repellent coatings(e. g., Sol-Gel coatings)• Super-thin paint coatings• Ion-implanted surfaces• Nano-coatings on sensors• Implants/medical applications• Matrix effects in alloys• Biological materials• Ceramic materials• Hardness determination on microsections• Automated measurements on multiplesamples• Coatings on PC hard disks/CDsMeasurable characteristic material quantitiesMaterial characteristics computed according to ISO 14577:• Martens hardness HM• Indentation hardness HIT (convertible toHV)• Modulus of indentation EIT• Percent elastic portion ??IT of the indentationwork Welast/Wtotal• Indentation creep CIT• ESP – mode, partial load and unloadmeasurements, for depth-dependantdetermination of quantities like EIT, HITknow more10218589348Get Best PriceCall Now Portable XRF SpectrometerAsk PriceUsage/Application: Coating Thickness MeasurementModel: Fischerscope XAN 500Brand: Fischer Minimum Order Quantity: 1 PieceUsage/Application: Coating Thickness MeasurementModel: Fischerscope XAN 500Brand: Fischer Delivery Time: 3 Weeks FISCHERSCOPE® X-RAY XAN® 500 Mobile X-RAY Fluorescence Measuring...Delivery Time: 3 WeeksFISCHERSCOPE® X-RAY XAN® 500Mobile X-RAY Fluorescence Measuring Instrument for Fast and Non-Destructive Material Analysis and Coating Thickness MeasurementThe FISCHERSCOPE X-RAY XAN 500 is a mobile and universally applicable energy dispersive x-ray fluorescence measuring instrument. It is well suited for the non-destructivecoating thickness measurement and material analysis. The instrument is perfectly suitable for measurements in quality assurance, incoming inspection and process control. Thanks to its small size, you can measure even on difficult geometries.Typical fields of application:• Measurements on large coated parts, like Machine components and housings• Mobile measurements in electroplating shops• Mobile measurements of precious metals• Determination of the metal content of electroplating baths (Solution analysis)Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPEX-RAY systems. The necessity of recalibration is considerably reduced, saving time and effort. The modern silicon drift detector achieves high accuracy and good detection sensitivity.The fundamental parameter method by FISCHER allows for the analysis of solid and liquid specimens as well as coating systems without calibration.know more15463624673Get Best PriceCall Now Material Analysis InstrumentAsk PriceApplication: Laboratory UseBrand: FISCHER Application: Laboratory UseBrand: FISCHER For exact material analysis, the broad assortment of Fischer X-ray fluorescence instruments (XRF) offers the optimal...For exact material analysis, the broad assortment of Fischer X-ray fluorescence instruments (XRF) offers the optimal instrument for any application.Trace analysis required by ROHS, testing of jewelry and gold or inline measurements in continuous production – FISCHERSCOPE X-RAY instruments fulfil the requirements in the laboratory and in manufacturingknow more10218584830Get Best PriceCall Now
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