Fischer Measurement Technologies India Private Limited
Pune, Maharashtra
GST 27AAACF9487H1Z6
TrustSeal Verified
Software Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568
Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in)
Measurements of functional coatings in the electronics and semiconductor industries
XDLM-PCB 210 and 220: Automated measurements, e.g., in quality control
Determining the composition of electroplating baths
General Specification
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)
to determine thin coatings, small structures and alloys.
Element range:Chlorine (17) to Uranium U (92) – up to 24 elements simultaneously.
Design:Bench-top unit with housing with a slot on the side
Measuring direction:Top down
X-ray tube:
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):XDLM-PCB 200/210: Ø 0.1 mm (3.9 mils), optional Ø 0.2 mm (7.9 mils),
slot 0.3 x 0.05 mm (11.8 x 2 mils)
Standard (523-440): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm
(2 x 2 mils); 0.2 x 0.03 mm (7.9 x 1.2 mils)
Optional (523-366): Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8
mils); 0.3 x 0.05 mm (11.8 x 2 mils)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot:approx. Ø 0.2 mm (7.9 mils)
Measurement distance:0 … 10 mm (0 … 0.4 in) Distance compensation with patented DCM for
simplified measurements at varying distances.For particular applications
or for higher demands on accuracy an additional calibration might be
necessary.
X-Ray Detection
X-ray detector:Proportional counter tube
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the
measurement location along the primary beam axis, Manual
focusing and auto-focus, Crosshairs with a calibrated scale
(ruler) and spot-indicator, Adjustable LED illumination,Laser
pointer (class 1) to support accurate,specimen placement.
Zoom factor:Digital 1x, 2x, 3x, 4x
Computer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
Dimensions | ||
---|---|---|
XDLM-PCB 200 | XDLM-PCB 210 | |
External dimensions | 610 x 750 x 450 mm | With maximum XY travel range: 1000 x 1265 x 470 mm (39.4 x 49.8 x 18.5 in) |
Width x depth x height | With extension: 1200 x 1050 x 450 mm (47.2 x 41.3 x 17.7 in) | XY table retracted in home position: 650 x 810 x 470 mm (25.6 x 31.9 x 18.5 in) |
Weight | Approx. 86 kg (190 lb) | Approx. 86 kg (190 lb) |
The PICODENTOR® HM500 is an automated nanoindentation measuring system and
employs the instrumented indentation test method according to ISO 14577 and ASTM
E2546. The instrument allows for sophisticated measuring applications with difficult
positioning and is perfectly suitable for measurements in development, quality assurance,
incoming inspection and process control.
Typical fields of application
• Hard material coatings and ultra-thin
DLC coatings
• Dirt-repellent coatings
(e. g., Sol-Gel coatings)
• Super-thin paint coatings
• Ion-implanted surfaces
• Nano-coatings on sensors
• Implants/medical applications
• Matrix effects in alloys
• Biological materials
• Ceramic materials
• Hardness determination on microsections
• Automated measurements on multiple
samples
• Coatings on PC hard disks/CDs
Measurable characteristic material quantities
Material characteristics computed according to ISO 14577:
• Martens hardness HM
• Indentation hardness HIT (convertible to
HV)
• Modulus of indentation EIT
• Percent elastic portion ??IT of the indentation
work Welast/Wtotal
• Indentation creep CIT
• ESP – mode, partial load and unload
measurements, for depth-dependant
determination of quantities like EIT, HIT
We will contact you soon !
Rakesh Bhan
(Managing Director)
Fischer Measurement Technologies India Private Limited
Hinjawadi, Pune,
Maharashtra,
India