COATING THICKNESS MEASUREMENT GAUGE FOR CONNECTORS : XDLM 237
Coating thickness measurement gauge for connectors - XDLM237 is engineered using best available techniques and following international industrial standard. These are X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analysis on PC-boards, electronics components and mass-produced parts, even on small structures. These are widely used for the measurement and analysis of thin coatings, even at small concentrations. These are acclaimed for its effective usage and longer service life. MODELSXDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis TYPICAL FIELDS OF APPLICATIONMeasurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards General SpecificationIntended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys.
Element range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously.
Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample
Measuring direction:Top down
X-Ray SourceX-ray tube:Micro focus tungsten tube with beryllium window
High voltage:Three steps 10 kV, 30 kV, 50 kV
Aperture (Collimator):4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request
Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image. Smallest measurement approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)
X-Ray DetectionX-ray detector:Silicon PIN detector with peltier cooling
Resolution (fwhm for Mn-Kα):≤ 200 eV
Measurement distance:0 … 80 mm (0 … 3.2 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.
Sample AlignmentVideo microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot- indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement.
