Fischer Measurement Technologies India Private Limited

Wafer coating thickness instrument - XUV 773 is one of the most preferred selections of clients owing to its precise design and outstanding accuracy. These are high performance X-ray fluorescence measuring instrument with vacuum chamber for non-destructive coating thickness measurement and material analysis. Engineered in accordance with international industrial standard, these devices are widely used for non-destructive analysis of thin coatings, traces and light elements. Up to 24 elements in the range of sodium (11) to uranium (92) can be determined simultaneously. Ergonomically designed these devices also provide facility for the measurement that it can be performed in vacuum, in ambient air or with helium purge (optional). Therefore also organic or wet samples can be analyzed.

 

 EN 61010

X-Ray standards:DIN ISO 3497 and ASTM B 568

Approval:Individual acceptance inspection as a fully protected instrument according

 to the German regulations „Deutsche Röntgenverordnung-RöV“.

DMP Series Gauge family for measuring coating thickness.

Base material electrically conductive (NF) Paint, varnish, plastic coating on Al, Cu or Brass (NC/NF) Anodized coating on Al (NC/NF)
Base material steel or iron (FE) Zn, Cr, Cu coating on steel or iron (NF/FE) Paint, varnish, plastic coating on steel or iron (NC/FE)



Features ∙ Universal device series for tactile coating thickness measurement thanks to enormously wide probe portfolio
∙Test method: Amplitudesensitive eddy current method
∙ Measured value memory: DMP20: 10,000 in one batch, DMP40: 250,000 in 2,500 batches
∙ Measurement range: Depending on the combination of coating and base material and the used probe
∙ Robust aluminum housing with protection class IP64
∙ Replaceable Li-Ion battery for > 24 h operating time
∙ Easy data transfer via USB-C and Bluetooth
∙ Limit monitoring via light, sound and vibration
∙ Digital and analog probes available for various applications

The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.







































General Specification

 

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)

  to determine thin coatings and alloys

Element range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously

Design:Bench-top unit with hood opening upwards XY-stage and Z-axis

electrically driven and programmable,Motor-driven changeable apertures

 and filters Video camera and laser pointer (class 1) for orienting the sample

Measuring direction:From top to bottom